Spectroscopy & Analytics
XPS, ARPES, MOKE, FTIR, TPD/TDS, UHV tribology, and surface characterization systems
Standard PES Systems
Stand-alone analysis chamber with load-lock for XPS, UPS, ARPES, AES, EELS, ISS, IPES and LEIPS in UHV.
Advanced PES Systems
Multi-chamber photoelectron spectroscopy designed for maximum compatibility with other surface science techniques.
Advanced HPPES Systems
Photoelectron spectroscopy from UHV to 50 mbar with a versatile gas cell, for research on gas–solid and gas–liquid interactions.
UHV Tribometer Systems
Modular UHV tribometer for friction, wear, indentation, and fracture studies from 10⁻⁹ mbar to 1 atm and -120 °C to 600 °C, with a 6-axis force sensor and closed-loop load control.
TPD/TDS Systems
Stand-alone UHV unit for temperature-programmed desorption: adsorption and desorption measurements on ultrathin films.
FTIR Spectroscopy Systems
UHV-compatible infrared spectroscopy for surface adsorbate and thin film vibrational analysis.
MOKE Systems
Real-time magneto-optical Kerr effect measurements on ultra-thin magnetic films and multilayers.
Standard HPPES Systems
High-pressure photoelectron spectroscopy from UHV to 50 mbar, bridging surface science and near-ambient studies in one instrument.