LT-STM/AFM
A Leader for 25 Years
Since the year 2000, the low-temperature scanning tunneling microscope has become an indispensable component within CreaTec's product portfolio, catering to a highly specialized audience operating at the pinnacle of scientific understanding. Its utilization extends beyond nanoanalytical fundamentals, encompassing both cutting-edge research and industrial metrology applications.
Tailored Precision for Your Demands
Our suite of 4 K microscopes, available in beetle-type scanning and PAN-type sliding configurations, offers exceptional customization. With features like magnetic field manipulation, optical access, and high-frequency cabling, we ensure your specific requirements are met.
A Reliable Workhorse
For nearly 25 years, our 4 K LT-STM/AFM unit has stood as a reliable workhorse, empowering you to concentrate on outcomes. With variable temperature capabilities ranging from 5 to 300 K and the introduction of our fully compatible low-temperature atomic force microscope in 2007, you can seamlessly push the boundaries of surface science.
Let the Data Speak for Itself
STS
Minimal modulation (< μV) bypassed modulation effects, underlining STM temperature's role in energy resolution.
STM
Our images reveal genuine atomic resolution (2 pm), herringbone (20 pm), and a superimposed standing wave — no decorated tips required.
AFM
nc-AFM assesses both conductive and insulating surfaces. We employed a qPlus® sensor with decorated tips (Xe or CO) on a range of benchmarking surfaces.